SC-Net: 弱监督的表面缺陷检测

SC-NET: WEAKLY SUPERVISED SURFACE DEFECT DETECTION

  • 摘要: 目前表面缺陷检测领域缺少一种标签制作成本低且检测效果好的深度学习方法。因此,提出一种使用二元分类标签的弱监督卷积神经网络。该模型使用 Segdec-Net 的模型框架,重新设计分割子网络的卷积层结构,解决缺陷轮廓分割不准确的问题,并提高分类效果。对分类子网络进行结构精简、随机失活处理等改进,缓解过拟合问题,进一步提高分类效果。实验结果表明,该方法分类平均精确率达到 96%,相比同类方法提高 22.7 百分点。

     

    Abstract: At present, the field of surface defect detection lacks a deep learning method with low cost of label production and good detection effect. Therefore, a weakly supervised convolutional neural network using binary classification labels is proposed. This model used the framework of Segdec-Net, redesigned the convolutional layer structure of the segmentation sub-network, solved the problem of inaccurate segmentation of defect contours, and improved the classification effect. The classification sub-network was improved by structure simplification and dropout processing, which alleviated the overfitting problem and further improved the classification effect. The experimental results show that the average classification accuracy of this method reaches 96%, which is 22.7 percentage points higher than similar methods.

     

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